Selected publications

  1. A charge transfer model for CMOS image sensors
    H. Liqiang; S. Yao; A.J.P. Theuwissen;
    IEEE Transactions on Electron Devices,
    Volume 63, Issue 1, pp. 32-41, 2016.

  2. Introduction to the special issue on solid-state sensors
    A.J.P. Theuwissen;
    IEEE Transactions on Electron Devices,
    Volume 63, Issue 1, pp. 5-9, 2016.

  3. A potential-based characterization of the transfer gate in CMOS image sensors
    Y. Xu; X. Ge; A.J.P. Theuwissen;
    IEEE Transactions on Electron Devices,
    Volume 63, Issue 1, pp. 42-48, 2016.

  4. A CMOS image sensor with nearly unity-gain source follower and optimized column amplifier
    X. Ge; A.J.P. Theuwissen;
    In E. Fontana; C. Ruiz-Zamarreno (Ed.), 2016 IEEE SENSORS,
    IEEE, pp. 1-3, 2016.

  5. A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique
    X. Ge; B. Mamdy; A.J.P. Theuwissen;
    In A. Darmont; R. Widenhorn (Ed.), IS&T International Symposium on Electronic Imaging,
    Society for Imaging Science and Technology, pp. IMSE-261, 2016.

  6. A Two Conversions/Sample Differential Slope Multiple Sampling ADC With Accelerated Counter Architecture
    K. Kitamura; A.J.P. Theuwissen;
    In P Magnan (Ed.), Proceedings of the International Image Sensor Workshop,
    International Image Sensor Society, pp. 417-420, 2015.

  7. Investigating transfer gate potential barrier by feed-forward effect measurement
    Y. Xu; X. Ge; A.J.P. Theuwissen;
    In P. Magnan (Ed.), Proceedings of the International Image Sensor Workshop,
    International Image Sensor Society, pp. 116-120, 2015.

  8. A miniaturized micro-digital sun sensor by means of low-power low-noise CMOS imager
    N. Xie; A.J.P. Theuwissen;
    IEEE Sensors Journal,
    Volume 14, Issue 1, pp. 96-103, 2014.

  9. Integrated polarization analyzing CMOS image sensors for detection and signal processing
    M. Sarkar; A.J.P. Theuwissen;
    S. Nihtianov; A Luque (Ed.);
    Woodhead Publishing Limited, , 2014. Book title : Integrated polarization analyzing CMOS image sensors for detection and signal processing.

  10. CMOS Image Sensors
    Albert Theuwissen;
    G. Meijer, M. Pertijs; K. Makinwa (Ed.);
    John Wiley \& Sons, , pp. 173-189, 2014. Book title : Smart Sensor Systems : Emerging Technologies and Applications.

  11. Biologically inspired CMOS image sensor for fast motion and polarization detection
    M. Sarkar; D.S.S. Bello; C. van Hoof; A.J.P. Theuwissen;
    IEEE Sensors Journal,
    Volume 13, Issue 3, pp. 1065-1073, 2013. Harvest Article number: 6381431.

  12. Low-power high-accuracy micro-digital sun sensor by means of a CMOS image sensor
    N. Xie; A.J.P. Theuwissen;
    Journal of Electronic Imaging,
    Volume 22, Issue 3, pp. 1-11, 2013.

  13. Feedforward effect in standard CMOS pinned photodiodes
    M. Sarkar; B. Buttgen; A.J.P. Theuwissen;
    IEEE Transactions on Electron Devices,
    Volume 60, Issue 3, pp. 1154-1161, 2013. Harvest Article number: 6420923.

  14. Column-parallel digital correlated multiple sampling for low-noise CMOS image sensors
    Y. Chen; Y. Xu; A.J. Mierop; A.J.P. Theuwissen;
    IEEE Sensors Journal,
    Volume 12, Issue 4, pp. 793-799, 2012.

  15. An autonomous microdigital sun sensor by a CMOS imager in space application
    N. Xie; A.J.P. Theuwissen;
    IEEE Transactions on Electron Devices,
    Volume 59, Issue 12, pp. 3405-3410, 2012. Harvest.

  16. Analyzing the radiation degradation of 4-transistor deep submicron technology CMOS image sensors
    J. Tan; B. Buttgen; A.J.P. Theuwissen;
    IEEE Sensors Journal,
    Volume 12, Issue 6, pp. 2278-2286, 2012. Harvest Article number: 6143978.

  17. A 0.7 e- rms temporal-readout-noise CMOS image sensor for low-light-level imaging
    Y. Chen; Y. Xu; Y. Chae; A. Mierop; X. Wang; A.J.P. Theuwissen;
    In H Hidaka; {Nauta et al}, B (Ed.), Digest of Technical Papers - 2012 IEEE International Solid-State Circuits Conference.,
    IEEE, pp. 384-386, 2012.

  18. Charge Domain Interlace Scan Implementation in a CMOS Image Sensor
    Y. Xu; A.J. Mierop; A.J.P. Theuwissen;
    IEEE Journal on Sensors,
    pp. 2621-2627, 2011.

  19. Integrated Polarization-Analyzing CMOS Image Sensor for Detecting Incoming Light Ray Direction
    M. Sarkar; D. San Segundo Bello; C. van Hoof; A.J.P. Theuwissen;
    IEEE Transactions on Instrumentation and Measurement,
    Volume 60, Issue 8, pp. 2759-2767, 2011.

  20. Charge Domain Interlace Scan Implementation in a CMOS Image Sensor
    Y. Xu; A. Mierop; A.J.P. Theuwissen;
    IEE Conference Publication Series,
    Volume 11, Issue 11, pp. 2621-2627, 2011.

  21. Integrated Polarization Analyzing CMOS Image Sensor for Real Time Material Classification
    M. Sarkar; D. San Segundo Bello; C. van Hoof; A.J.P. Theuwissen;
    IEEE Sensors Journal,
    Volume 11, Issue 8, pp. 1692-1703, 2011.

  22. Column-Parallel Single Slope ADC with Digital Correlated Multiple Sampling for Low Noise CMOS Image Sensors
    Y. Chen; A.J.P. Theuwissen; Y. Chae;
    In Procedia Engineering (Proceedings of the 25th Eurosensors Conference,
    pp. 1265-1268, 2011.

  23. Ageing effects on image sensors due to terrestrial cosmic radiation
    G.G. Nampoothiri; A.J.P. Theuwissen; M. Horemans;
    In S Süsstrunk; M Rabbani (Ed.), Electonic Imaging,
    SPIE, pp. 1-5, 2011.

  24. Ageing Effects on Image Sensors: Neutron Irradation Studies on Wafer and Packages CCD and CMOS devices
    G.G. Nampoothiri; A.J.P. Theuwissen;
    In K Chesnut; R Reed (Ed.), Proceedings of Nuclear and Space Radiation Effects Conference 2011,
    IEEE, pp. -, 2011.

  25. An autonomous low power high resolution micro-digital sun sensor
    N. Xie; A.J.P. Theuwissen;
    In L Zhou; G Jin (Ed.), 2011 International Symposium on Photoelectric Detection and Imaging (ISPDI2011),
    SPIE, pp. 1-8, 2011.

  26. Column-Parallel Circuits with Digital Correlated Multiple Sampling for Low Noise CMOS Imagers
    Y. Chen; Y. Xu; A. Mierop; A.J.P. Theuwissen;
    In N Terashini; J Nakamura (Ed.), 2011 International Image Sensor Workshop (IISW),
    Image Sensors, pp. 78-81, 2011.

  27. Ageing Effects on Image Sensors: Neutron Irradiation Studies on Wafer and Packaged devices
    G.G. Nampoothiri; A.J.P. Theuwissen;
    In N Teranishi; J Nakamura; S Kawahito (Ed.), 2011 International Image Sensor Workshop (IISW),
    IISW, pp. 66-69, 2011.

  28. 4T CMOS Image Sensor Pixel Degradation due to X-ray Radiation
    J. Tan; B. Buettgen; A.J.P. Theuwissen;
    In N Terashini; J Nakamura (Ed.), 2011 International Image Sensor Workshop - IISW,
    Image Sensors, pp. 228-231, 2011.

  29. An Autonomous micro-Digital Sun Sensor Implemented with a CMOS Image Sensor Achieving 0.004o Resolution @ 21 mW
    N. Xie; A.J.P. Theuwissen; B. Buttgen;
    In N Teranishi; J Nakamura; S Kawahito (Ed.), International Image Sensor Workshop (IISW 2011),
    IISW, pp. 208-211, 2011.

  30. X-ray radiation effect on CMOS imagers with in-pixel buried-channel source follower
    Y. Chen; J. Tan; X. Wang; A.J. Mierop; A.J.P. Theuwissen;
    In H Tenhunen; M Aberg (Ed.), 41st IEEE European Solid-State Device Research Conference (ESSDERC) 2011,
    IEEE, pp. 155-158, 2011.

  31. Single slope analog-to-digital converter
    M.F. Snoeij; A.J.P. Theuwissen; J.H. Huijsing;
    2011.

  32. The APS+ and why we dare going without DARE
    J. Leijtens; N. Xie; A.J.P. Theuwissen;
    In {Bedi et al}, R (Ed.), Proceedings of 3rd International workshop on Analog and Mixed signal Integrated Circuits for Space Applications (AMICSA 2010),
    ESA, pp. 1-18, 2010.

  33. X-ray radiation effects on CMOS image sensor in-pixel devices
    J. Tan; B. Buttgen; A.J.P. Theuwissen;
    In s.n. (Ed.), Proceedings of International conference on solid-state devices and materials 2010,
    pp. 299-300, 2010.

  34. In-pixel buried-channel source follower in CMOS image sensors exposed to X-ray radiation
    C. Yue; J. Tan; X. Wang; A. Mierop; A.J.P. Theuwissen;
    In s.n. (Ed.), Proceedings of IEEE sensors 2010,
    IEEE, pp. 1649-1652, 2010.

  35. Biologically inspired autonomous agent navigation using an integrated polarization analyzing CMOS image sensor
    M. Sarkar; D. San Segundo Bello; C. van Hoof; A.J.P. Theuwissen;
    In B Jakoby; M.J. Vellekoop (Ed.), Proceedings EUROSENSOR XXIV Conference 2010,
    Elsevier, pp. 673-676, 2010.

  36. Integrated polarization-analyzing CMOS image sensor for detecting incoming light ray direction
    M. Sarkar; D. San Segundo Bello; C. van Hoof; A.J.P. Theuwissen;
    In S Mandayam; K Arshak (Ed.), Proceedings of 2010 IEEE Sensors Applications Symposium,
    IEEE, pp. 194-199, 2010.

  37. Total ionizing effects on 4-transistor CMOS image sensor pixels
    J. Tan; A.J.P. Theuwissen;
    In JB Xu; PKT Mok (Ed.), Proceedings of IEEE International conference on Electron Devices and Solid-State Circuits (EDSSC'10),
    IEEE, pp. 1-4, 2010.

  38. A biologically inspired collision detection algorithm using differential optic flow imaging
    M. Sarkar; D. San Segundo Bello; C. van Hoof; A.J.P. Theuwissen;
    In TG Constandinou (Ed.), Proceedings of IEEE BIOCAS 2010,
    IEEE, pp. 250-253, 2010.

  39. A CMOS image sensor with charge domain interlace scan
    Y. Xu; A. Mierop; A.J.P. Theuwissen;
    In T Kenny; G Fedder (Ed.), Proceedings of IEEE Sensors 2010,
    IEEE, pp. 123-127, 2010.

  40. The APS+ : an intelligent active pixel sensor centered on low power
    N. Xie; A.J.P. Theuwissen; B. Buettgen; H. Hakkesteegt; H. Jansen; J. Leijtens;
    In {Armandillo et al}, E (Ed.), Proceedings of International Conference on Space Optics (ICSO 2010),
    ESA, pp. 1-4, 2010.

  41. Now is the time for the sunsensor of the future
    J. Leijtens; K. de Boom; M. Durkut; H. Hakkesteegt; A.J.P. Theuwissen; N. Xie;
    In {Armandillo et al.}, E (Ed.), Proceedings of the 2010 International Conference on Space Optics,
    ESA/ESTEC, pp. 1-6, 2010. CD-ROM.

  42. Integrated polarization analyzing CMOS image sensor for autonomous navigation using polarized light
    M. Sarkar; D. San Segundo Bello; C. van Hoof; A.J.P. Theuwissen;
    In P Chountas; J Kacprzyk (Ed.), Proceedings of the 2010 5th IEEE Conference on Intelligent Systems,
    IEEE, pp. 224-229, 2010.

  43. Radiation effects on CMOS image sensors due to X-rays
    J. Tan; B. Buttgen; A.J.P. Theuwissen;
    In J Breza; D Donoval; E Vavrinsky (Ed.), Proceedings 8th International conference on Advanced Semiconductor Devices and Microsystems (ASDAM),
    IEEE, pp. 279-283, 2010.

  44. An analog and digital representation of polarization using CMOS image sensors
    M. Sarkar; D. San Segundo Bello; C. van Hoof; A.J.P. Theuwissen;
    In s.n. (Ed.), Proceedings 5th EOS Topical Meeting on Advanced Imaging Techniques,
    s.n., pp. 1-2, 2010.

  45. Micro-digital sun sensor: an imagining sensor for space applications
    N. Xie; A.J.P. Theuwissen; B. Buettgen; H. Hakkesteegt; H. Jansen; J. Leijtens;
    In s.n. (Ed.), Proceedings of IEEE International symposium on industrial electronics,
    IEEE, pp. 3362-3365, 2010.

  46. Integrated polarization analyzing CMOS image sensor
    M. Sarkar; D. San Segundo Bello; C. van Hoof; A.J.P. Theuwissen;
    In {Amara et al.}, A (Ed.), Proceedings of 2010 IEEE International Symposium on Circuits and Systems,
    IEEE, pp. 621-624, 2010.

  47. Better pictures through physics: the state of art of CMOS image sensors
    A.J.P. Theuwissen;
    2010.

  48. Sensors getting worse, images getting better
    A.J.P. Theuwissen;
    2010.

  49. A CMOS image sensor with in pixel buried channel source follower and optimized row selector
    C. Yue; X. Wang; A. Mierop; A.J.P. Theuwissen;
    pp. 2390-2397, 2009.

  50. On-Chip Pixel Binning in Photon-Counting EMCCD-Based Gamma Camera: A Powerful Tool for Noise Reduction
    A.H. Westra; J.W.T. Heemskerk; M.A.N. Korevaar; A.J.P. Theuwissen; R. Kreuger; K.M. Ligtvoet; F.J. Beekman;
    IEEE Transactions on Nuclear Science,
    Volume 56, pp. 2559-2565, 2009.

  51. Characterization of in pixel buried channel source follower with optimized row selector in CMOS image sensors
    Y. Chen; X. Wang; A. Mierop; A.J.P. Theuwissen;
    s.n. (Ed.);
    International Image Sensor Workshop, , pp. 0-4, 2009.

  52. Investigating the ageing effects on image sensors due to terrestrial cosmic radiation
    G. Nampoothiri; A.J.P. Theuwissen;
    s.n. (Ed.);
    International Image Sensor Workshop, , pp. 01-04, 2009.

  53. Degradation of CMOS image sensors in deep-submicron technology due to gamma-radiation
    Rao padmakumar; X. Wang; A.J.P. Theuwissen;
    Solid-State Electronics,
    Volume 52, pp. 1407-1413, 2008.

  54. Influence of terrestrial cosmic rays on the reliability of CCD image sensors-pat 2:experiments at elevated temperature
    A.J.P. Theuwissen;
    IEEE Transactions on Electron Devices,
    Volume 55, Issue 9, pp. 2324-2328, 2008.

  55. CMOS image sensors:state-of-the-art
    A.J.P. Theuwissen;
    Solid-State Electronics,
    Volume 52, pp. 1401-1406, 2008.

  56. CCD structures implemented in standard 0.18 micrometer CMOS technology
    Rao padmakumar; X. Wang; A.J.P. Theuwissen;
    Electronics Letters,
    Volume 44, Issue 8, pp. 548-549, 2008.

  57. Negative offset operation of four-transistor CMOS image pixels for increased well capacity and suppressed dark current
    B. Mheen; Y. Joo-song; A.J.P. Theuwissen;
    IEEE Electron Device Letters,
    Volume 29, Issue 4, pp. 347-349, 2008.

  58. A CMOS image sensor with a buried-channel source follower
    X. Wang; M.F. Snoeij; R. Padma kumar rao; A. Mierop; A.J.P. Theuwissen;
    In s.n. (Ed.), Proceedings of ISSCC 2008,
    IEEE, pp. 62-63, 2008.

  59. A CMOS image sensor with row and column profiling means
    N. Xie; A.J.P. Theuwissen; X. Wang; J. Leijtens; H. Hakkesteegt; H. Jansen;
    In s.n. (Ed.), Proceedings of IEEE Sensors 2008,
    IEEE Sensors, pp. 1356-1359, 2008.

  60. Multiple-ramp column-parallel ADC architectures for CMOS image sensors
    M.F. Snoeij; A.J.P. Theuwissen; K.A.A. Makinwa; J.H. Huijsing;
    IEEE Journal of Solid State Circuits,
    Volume 42, Issue 12, pp. 2968-2977, 2007.

  61. Technical Challenges and Recent progress in CCD Imagers
    J.T. Bosiers; C. Draijer; A.J.P. Theuwissen;
    Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment,
    pp. 148-156, 2007.

  62. Gamma-ray effects on CMOS image sensors in deep sub-micron technology
    Rao padmakumar; X. Wang; A. Mierop; A.J.P. Theuwissen;
    s.n. (Ed.);
    International Image sensor, , pp. 70-73, 2007.

  63. A CMOS image sensor with a column-level multiple-ramp single-slope ADC
    M.F. Snoeij; P. Donegan; A.J.P. Theuwissen; K.A.A. Makinwa; J.H. Huijsing;
    In s.n. (Ed.), Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International,
    IEEE, pp. 1-4, 2007.

  64. Characterization of a buried-channel n-MOST source followers in CMOS image sensors
    X. Wang; Rao padmakumar; A.J.P. Theuwissen;
    In s.n. (Ed.), Proceedings of the 2007 International Image Sensor Workshop,
    ImageSensors Inc., pp. 223-245, 2007.

  65. Degradation of spectral response and dark current of CMOS image sensor in deep-submicron technology due to gamma-irradiation
    Rao padmakumar; X. Wang; A.J.P. Theuwissen;
    In s.n. (Ed.), ESSDERC 2007 Proceedings of the 37th European Solid-State Device Research Conference,
    IEEE, pp. 370-373, 2007.

  66. Power and Area Efficient Column-Parallel ADC Architectures for CMOS Image Sensors
    M.F. Snoeij; A.J.P. Theuwissen; J.H. Huijsing; K.A.A. Makinwa;
    In s.n. (Ed.), Proceedings IEEE Sensors 2007,
    IEEE, pp. 523-526, 2007.

  67. The Hole Role in Solid-State Imagers
    A.J.P. Theuwissen;
    pp. 2972-2980, 2006.

  68. A CMOS Imager With Column-Level ADC Using Dynamic column Fixed-pattern Noise Reduction (U-SP-2-I-ICT)
    M.F. Snoeij; A.J.P. Theuwissen; K.A.A. Makinwa; J.H. Huijsing;
    IEEE Journal of Solid State Circuits,
    Volume 41, Issue 12, pp. 3007-3015, 2006.

  69. A CMOS Imager with Column-Level ADC Using Dynamic Column FPN Reduction (U-SP-2-I-ICT)
    M.F. Snoeij; A.J.P. Theuwissen; K.A.A. Makinwa; J.H. Huijsing;
    s.n. (Ed.);
    s.l., , pp. 498-499, 2006.

  70. "Smart FPA's : Are They Worth the Effort?" (U-SP-2-I-ICT)
    J. Leijtens; A.J.P. Theuwissen; J.P. Magnan;
    s.n. (Ed.);
    SPIE, , pp. 1-5, 2006.

  71. A CMOS Imager with column-level ADC using dynamic column FPN reduction (U-SP-2-I-ICT)
    M.F. Snoeij; A.J.P. Theuwissen; K.A.A. Makinwa; J.H. Huijsing;
    s.n. (Ed.);
    s.l., , pp. 2014-2023, 2006.

  72. Column-parallel single-slope ADCS for CMOS image sensors (U-SP-2-I-ICT)
    M.F. Snoeij; A.J.P. Theuwissen; K.A.A. Makinwa; J.H. Huijsing;
    s.n. (Ed.);
    Eurosensors, , pp. 1-4, 2006.

  73. CMOS Image Sensors for Ambient Intelligence (U-SP-2-I-ICT)
    A.J.P. Theuwissen; M.F. Snoeij; X. Wang; R. Padma kumar rao; E. Bodegom;
    {S. Mukherjee} (Ed.);
    Springer, , pp. 125-150, 2006.

  74. "Influence of Terrestrial Cosmic rays on Solid-state Image Sensors" (U-SP-2-I-ICT)
    A.J.P. Theuwissen;
    In Spektrum Forum,
    Fachhochschule, pp. -, 2006.

  75. "Fixed-pattern Noise induced by Transmission Gate in Pinned 4T CMOS Image Sensor Pixels" (U-SP-2-I-ICT)
    X. Wang; Rao padmakumar; A.J.P. Theuwissen;
    In s.n. (Ed.), Proceedings of the 38th European solid-state device research conference (ESSDERC),
    ESSDERC, pp. 331-334, 2006.

  76. "Column-parallel Single Slope ADCs for CMOS Image Sensors" (U-SP-2-I-ICT)
    M.F. Snoeij; A.J.P. Theuwissen; K.A.A. Makinwa; J.H. Huijsing;
    In s.n. (Ed.), Eurosensors XX 2006,
    Eurosensors, pp. 284-287, 2006.

  77. "Random Telegraph Signal in CMOS Image Sensor Pixels" (U-SP-2-I-ICT)
    X. Wang; Rao padmakumar; A. Mierop; A.J.P. Theuwissen;
    In s.n. (Ed.), Proceedings of the Electron Devices Meeting, 2006. IEDM '06. International,
    IEEE, pp. 115-118, 2006.

  78. A 1.8 V 3.2 /spl mu/W comparator for use in a CMOS imager column-level single-slope ADC
    M.F. Snoeij; A.J.P. Theuwissen; J.H. Huijsing;
    In s.n. (Ed.), ISCAS 2005, IEEE International Symposium on Circuits and Systems, 2005,
    IEEE, pp. 6162-6165, 2005. Editor onbekend, WPM.

  79. The effect of switched biasing on 1/f noise in CMOS imager front-ends
    M.F. Snoeij; A.J.P. Theuwissen; J.H. Huijsing;
    In s.n. (Ed.), Proceedings of the 2005 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors,
    s.n., pp. 68-71, 2005. Editor onbekend, WPM.

  80. A low-power column-parallel 12-bit ADC for CMOS imagers
    M.F. Snoeij; A.J.P. Theuwissen; J.H. Huijsing;
    In s.n. (Ed.), Proceedings of the 2005 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors,
    s.n., pp. 169-172, 2005. Editor onbekend, WPM.

  81. Research overview of 'Solid-state image sensors in deep sub-micron CMOS technology
    X. Wang; A.J.P. Theuwissen;
    Delft University of Technology, Volume STW-project 5869 , 2004.

  82. Study, modelling and charactirization of silicon surface, interface and bulk effects on the response of a CMOS image sensor in 0.18-micrometer technology
    P. Ramachandra Rao; A.J.P. Theuwissen;
    Technologiestichting STW, Volume STW-project 5869 , 2004. nog niet eeder opgevoerd JH.

  83. Leakage current modeling of test structures for characterization of dark current in CMOS image sensors
    N.V. Loukianova; H-O. Folkerts; J.P.V. Maas; D.W.E. Verbugt; A.J. Mierop; W. Hoekstra; E. Roks; A.J.P. Theuwissen;
    IEEE Transactions on Electron Devices,
    Volume 50, Issue 1, pp. 77-83, 2003.

  84. An image sensor which captures 100 consecutive frames at 1 000 000 frames/s
    T. Goji Etoh; D. Poggemann; G. Kreider; H. Mutoh; A.J.P. Theuwissen; A. Ruckelshausen; Y. Kondo; H. Maruno; K Takubo; H Soya; K Takehara; T Okinaka; Y Takano;
    IEEE Transactions on Electron Devices,
    Volume 50, Issue 1, pp. 144-151, 2003.

  85. A 35-mm format 11 M pixel full-frame CCD for professional digital still imaging
    J.T. Bosiers; B.G.M. Dillen; C. Draijer; A.C. Kleimann; F.J. Polderdijk; M. de Wolf; W. Klaassens; A.J.P. Theuwissen; H.L. Peek; H-O. Folkerts;
    IEEE Transactions on Electron Devices,
    Volume 50, Issue 1, pp. 254-265, 2003.

  86. Simulation-based development and characterization of a CCD architecture for 1 million frames per second
    D. Poggemann; A. Ruckelshausen; T. Goji Etoh; A.J.P. Theuwissen; J.T. Bosiers; H. Mutoh; Y. Kondo;
    In MM Blouke; N Sampat; RJ Motta (Ed.), Proceedings of electronic imaging, science, and technology; sensors and camera systems for scientific, industrial, and digital photography applications IV,
    The Society for Imaging Science and Technology, pp. 185-195, 2003.

  87. Adaptive pixel defect correction
    A.A. Tanbakuchi; A. van der Sijde; B. Dillen; A.J.P. Theuwissen; W. de Haan;
    In MM Blouke; N Sampat; RJ Motta (Ed.), Proceedings of electronic imaging, science and technology; sensors and camera systems for scientific, industrial, and digital photography applications IV,
    The Society for Imaging Science and Technology, pp. 360-370, 2003.

  88. Ultra-high resolution image capturing and processing for digital cinematography
    A.J.P. Theuwissen; J. Coghill; L. Ion; F. Shu; H. Siefken; C. Smith;
    In s.n. (Ed.), ISSCC 2003 IEEE international solid-state circuits conference,
    IEEE, pp. 162-163, 2003.

  89. Frame transfer CCDs for digital still cameras: concept, design, and evaluation
    J.T. Bosiers; A.C. Kleimann; H.C. van Kuijk; L. Le Cam; H.L. Peek; J.P. Maas; A.J.P. Theuwissen;
    IEEE Transactions on Electron Devices,
    Volume 49, Issue 3, pp. 377-386, 2002.

  90. Read-out circuits for fixed-pattern noise reduction in a CMOS active pixel sensor
    M.F. Snoeij; A.J.P. Theuwissen; J.H. Huijsing;
    In Proceedings of SeSens 2002,
    STW Stichting voor de Technische Wetenschappen, pp. 676-676, 2002.

  91. A CCD image sensor of 1Mframes/s for continuous image capturing 103 frames
    T. Goji Etoh; D. Poggemann; A. Ruckelshausen; A.J.P. Theuwissen; G. Kreider; H-O. Folkerts; H. Mutoh; Y. Kondo; H. Maruno; K Takubo; H Soya; K Takehara; T Okinaka; Y Takano; T Reisinger; C Lohmann;
    In JH. Wuorinen (Ed.), 2002 IEEE International solid-state circuits conference: 2002 Digest of technical papers,
    IEEE, pp. 46-47, 2002. plus page 433.

  92. A 1/1.8" 3M pixel FT-CCD with on-chip horizontal sub-sampling for DSC applications
    L. Le Cam; J.T. Bosiers; A.C. Kleimann; H.C. van Kuijk; J.P. Maas; M.J. Beenhakkers; H.L. Peek; P.C. van de Rijt; A.J.P. Theuwissen;
    In JH. Wuorinen (Ed.), 2002 IEEE International solid-state circuits conference: 2002 Digest of technical papers,
    IEEE, pp. 34-35, 2002. plus page 442.

  93. CCD or CMOS image sensors for consumer digital still photography?
    A.J.P. Theuwissen;
    In VLSI'2001: proceedings,
    IEEE, pp. 168-171, 2001.

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